Advantest Unveils MTe – Unified, Scalable Test Platform for Power Semiconductor Devices

Core Insights - Advantest Corporation has launched the MTe power test platform, which aims to enhance test efficiency and scalability for the growing power semiconductor market [1][2]. Group 1: Market Demand and Product Features - There is an increasing market demand for electrification across various sectors, including automotive, industrial, renewable energy, telecommunications, and data infrastructure, driving semiconductor manufacturers to improve performance and reduce cost of test (CoT) [2]. - The MTe platform features a modular hardware architecture, advanced digital control, and system scalability, setting a new standard in power semiconductor test performance and efficiency [2][3]. - The platform is designed to address challenges related to wide-bandgap semiconductors such as SiC and GaN, and integrates digital IP cores on power devices, offering high bandwidth capture and dynamic testing capabilities [3][4]. Group 2: Performance and Customer Feedback - The MTe platform's distributed computing architecture allows for significant multisite test efficiency and high-parallel-test solutions, optimizing throughput [4]. - Early evaluations from customers in automotive and industrial power applications indicate substantial productivity and throughput improvements compared to legacy testers [4]. Group 3: Company Background - Advantest Corporation, founded in 1954 and headquartered in Tokyo, is a leading manufacturer of automatic test and measurement equipment for semiconductors, with a commitment to sustainable practices and social responsibility [5].