引领战略赛道 聚光科技半导体痕量杂质分析检测方案实现规模化应用
FPIFPI(SZ:300203) Quan Jing Wang·2025-11-06 04:16

Core Insights - The company, 聚光科技, has successfully developed the EXPEC 7350s ICP-MS/MS system for trace impurity analysis in semiconductor materials, achieving large-scale application in upstream supply chains [1][2][3] - The semiconductor metrology and inspection equipment market is projected to grow from approximately $9.8 billion in 2024 to $18.7 billion by 2034, with a CAGR of 6.9% from 2025 to 2034 [2] - The EXPEC 7350s system has passed evaluations from major wafer manufacturing companies, indicating its deep penetration into critical quality control processes in semiconductor manufacturing [3] Company Developments - 聚光科技 has integrated advanced technologies in its AMC-1000 micro-pollutant gas monitoring system, which can accurately monitor major gaseous pollutants in semiconductor production environments [3] - The company has achieved significant breakthroughs in promoting its GDM series special gas alarm products, with thousands of units purchased by chip and panel manufacturers, supporting the domestic substitution process in gas monitoring [3] - 聚光科技 has successfully obtained US EPA certification for its PM2.5 air particle analyzers, making it the first domestic high-end analytical instrument manufacturer to achieve full series certification [4] Industry Context - Impurity element analysis is essential in integrated circuit manufacturing, impacting manufacturing precision and product quality [2] - The ICP-MS/MS technology is becoming the mainstream method for impurity detection in the semiconductor industry due to its ultra-trace detection capabilities [2] - The company is positioned to lead the domestic high-end instrument sector, contributing to the high-end, large-scale upgrade of China's scientific instrument industry [5]