恩智浦取得测量设备专利

Core Viewpoint - NXP Semiconductors has obtained a patent for a device related to measurement, with the authorization announcement number CN114079518B, and the application date was July 2021 [1] Group 1 - The patent pertains to measurement equipment, indicating NXP's ongoing innovation in technology [1] - The patent was officially granted by the National Intellectual Property Administration, showcasing the company's commitment to intellectual property [1]