扫描电镜总用不好？北理工老师带你破解制样与拍摄难题！

Core Viewpoint - The article promotes a specialized course on scanning electron microscopy (SEM) aimed at addressing common challenges faced by users, including sample preparation, operational difficulties, and spectrum analysis [1][2][3][4]. Group 1: Course Overview - The course is taught by Zhang Niu from Beijing Institute of Technology, who has extensive experience in SEM and related instruments, making complex knowledge accessible [1]. - It targets three main pain points in SEM usage: sample preparation, operational challenges, and spectrum analysis [2][3][4]. Group 2: Course Content - The course is structured into three modules: - Module 1 focuses on sample preparation methods for various types of samples, including powders and biological specimens, emphasizing tool selection and procedural steps [5]. - Module 2 covers practical operational techniques and pitfalls, guiding users from sample introduction to parameter optimization and high-resolution image acquisition [6]. - Module 3 delves into spectrum testing techniques, enabling users to interpret data accurately beyond just image observation [7]. Group 3: Target Audience and Benefits - The course is designed for beginner SEM users, laboratory technicians, and researchers/students who need to enhance their SEM skills for better experimental outcomes [9]. - It offers benefits such as the ability to revisit course materials, a dedicated learning group for discussions, and personalized support from the instructor [9].