扫描电镜总用不好？北理工老师带你破解制样与拍摄难题！

Core Viewpoint - The article promotes a specialized course on scanning electron microscopy (SEM) aimed at addressing common challenges faced by users, including sample preparation, operational difficulties, and spectrum analysis [1][2][3][4]. Group 1: Course Overview - The course is taught by Zhang Niu from Beijing Institute of Technology, who has extensive experience in SEM and related instruments, making complex knowledge accessible [1]. - It targets three main pain points in SEM usage: sample preparation, operational challenges, and spectrum analysis difficulties [2][3][4]. Group 2: Course Content - The course is structured into three modules: - Module 1 focuses on sample preparation methods for various types of samples, including powders and biological samples, detailing tool selection and procedural steps [5]. - Module 2 covers practical operational techniques and pitfalls, guiding users from sample entry preparation to high-resolution image acquisition [6]. - Module 3 addresses spectrum testing techniques and quantitative analysis, enhancing users' analytical skills [7]. Group 3: Target Audience - The course is designed for: - Beginner SEM users seeking to quickly master core skills in sample preparation and operation [9]. - Laboratory technicians aiming to optimize SEM workflows and improve efficiency [11]. - Researchers and students needing high-quality SEM images for their projects [11]. Group 4: Learning Benefits - The course allows for repeated viewing, facilitating review of key content [12]. - Participants can join a dedicated learning group for discussions and personalized support from the instructor [12].