地质地球所专利成果：透射电镜和原子探针原位分析样品台

Core Viewpoint - The article discusses the development of a multifunctional sample stage by the Chinese Academy of Sciences, which addresses the challenges of fixing needle-like samples for transmission electron microscopy (TEM) and atom probe tomography (APT), enhancing testing accuracy and reducing costs [1]. Group 1: Instrumentation and Technology - The research highlights the importance of TEM and APT in nanoscale and atomic-scale materials science and geoscience, with TEM providing comprehensive analysis capabilities while APT offers high spatial resolution and sensitivity for all elements [2][3]. - The article outlines the limitations of current methods, such as the inability of TEM to analyze trace elements and the challenges faced in adapting sample stages for different TEM models [3][4]. Group 2: Proposed Solution - A new technical solution for a multifunctional sample stage has been proposed, which includes a support platform with a two-tiered structure and a D-shaped second base section for compatibility with APT instruments [4][11]. - The design allows for stable support of needle-like samples during analysis, preventing bending or damage, and ensuring accurate test results [11][12]. Group 3: Benefits and Innovations - The multifunctional sample stage can perform both conventional APT analysis and TEM-APT in situ analysis, effectively lowering costs associated with testing [12]. - The research has resulted in patents granted by the National Intellectual Property Administration, indicating the innovation's significance in the field [13].