“长寿”！飞纳发布第七代台式扫描电镜Phenom G7

Core Viewpoint - Phenom has launched its seventh-generation desktop scanning electron microscope series, the Phenom P series G7, which includes three models: Phenom ProX G7, Phenom Pro G7, and Phenom Pure G7. This launch represents a significant upgrade since the first product was introduced in 2006 [2]. Group 1: Product Features - The G7 series features a significant upgrade in filament lifespan, with the new CeB6 (cerium hexaboride) filament's lifespan increased from 1500 hours to 3000 hours, allowing for an average replacement cycle of about 5 years instead of 3 years under regular usage [2][4]. - The G7 series emphasizes low-voltage imaging capabilities, enhancing imaging performance for non-conductive, poorly conductive, and electron beam-sensitive samples, while reducing charging effects. Some samples can be observed without gold sputter coating [4]. - The series maintains an integrated design philosophy, with a built-in energy dispersive spectrometer (EDS) that allows users to perform electronic optical settings, image acquisition, and spectral composition analysis within the same software interface [4]. Group 2: Technical Specifications - For the Phenom ProX G7 model, the optical magnification reaches up to 350,000 times, with acceleration voltages available at fixed levels of 2kV, 5kV, 10kV, 15kV, and 20kV, and a continuous adjustable range from 4.8kV to 20.5kV in advanced mode [6][9]. - The G7 series includes a high-sensitivity four-segment backscattered electron detector as standard, with an optional secondary electron detector (SED) for real-time image mixing [8]. - The system is designed for ease of use, with a sample vacuum time of less than 15 seconds and a total time of less than 30 seconds from sample preparation to obtaining high-resolution images [8].