Advances in simultaneous SEM imaging while FIB milling provide unmatched feedback for precision endpointing New ZEISS Gemini 4 electron optics offer superior resolution and signal-to-noise ratioLive SEM imaging extended to monitor rapid FIB milling down to ultrafine lamella polishingLargest undistorted field-of-view supports the best outcomes in 3D tomography and APT workflows ZEISS today unveiled the new ZEISS Crossbeam 750 focused ion beam-scanning electron microscope (FIB-SEM) that is optimized for deman ...