美光科技取得针对封装内存储器的直接测试专利

Core Viewpoint - Micron Technology has been granted a patent for "Direct Testing of Embedded Memory," indicating advancements in memory technology and potential competitive advantages in the semiconductor industry [1] Group 1 - The patent granted to Micron is identified by the announcement number CN113921073B and was applied for on June 2021 [1]