Core Viewpoint - The research team from Xi'an University of Electronic Science and Technology has made a significant breakthrough in semiconductor material technology, enhancing chip heat dissipation efficiency and overall performance, providing a replicable Chinese model for high-quality integration of various semiconductor materials [1][7]. Group 1: Breakthrough Details - The team injected high-energy ions into the crystal nucleation layer of third-generation gallium nitride (GaN) semiconductor chips, smoothing the previously uneven surface, which reduced thermal resistance to one-third of its original value [7]. - This innovation addresses common heat dissipation challenges faced by third-generation and future semiconductor chips [7]. Group 2: Performance Improvements - The newly developed GaN microwave power devices exhibit a performance increase of 30% to 40% in power density compared to the most advanced similar devices currently available [9]. - The application of this technology in detection equipment can significantly extend detection range, while in communication base stations, it can achieve greater signal coverage and lower energy consumption [9]. Group 3: Future Implications - The technology's benefits will gradually become apparent to the general public, potentially enhancing signal reception capabilities in remote areas and extending battery life in mobile devices [9]. - Ongoing research is exploring the use of diamond materials for even better heat dissipation, which could further increase semiconductor device power handling capabilities by an order of magnitude, potentially reaching ten times the current levels [9].
西安电子科技大学攻克世界难题!
半导体芯闻·2026-01-14 09:42