Core Viewpoint - The article emphasizes the importance of field emission scanning electron microscopy (FE-SEM) as a critical skill in research and industrial testing, addressing the common challenges faced by learners in mastering this technology [3][4]. Group 1: Learning Challenges - Theoretical concepts such as electron imaging and compositional analysis are abstract and difficult to grasp, making self-study feel like "reading a foreign language" [3]. - Practical issues arise in sample preparation and parameter adjustment due to a lack of systematic guidance, leading to inefficient learning paths [3]. - Advanced techniques like high-resolution imaging and special sample analysis are hard to access, leaving learners without practical methods for progression [3]. Group 2: Training Program Benefits - The training program aims to address these challenges by focusing on understanding, application, and advancement in FE-SEM skills [4]. - Participants will build a comprehensive knowledge system, thoroughly understanding the principles and imaging mechanisms of electron microscopy [4]. - Practical skills will be developed, including sample preparation, parameter tuning, and troubleshooting, with an expected increase in experimental efficiency by over 50% [5]. - Advanced skills will be unlocked, enabling participants to overcome research and testing bottlenecks [5]. - Graduates will receive a certificate and gain practical experience, positioning them as the "electron microscope expert" within their teams, enhancing job prospects and project applications [5].