Core Insights - Onto Innovation Inc. has launched the Atlas G6 optical critical dimension (OCD) metrology system, designed for next-generation GAA transistors and high-bandwidth memory (HBM) applications, enhancing precision in process control [1][9] - The semiconductor industry is experiencing tighter dimensions, with manufacturers facing up to 30% reductions each cycle, necessitating precise measurements for GAA and smaller DRAM cell blocks [2] - The Atlas G6 features smaller spot sizes and improved signal-to-noise performance, crucial for measuring shrinking geometries directly on devices without compromising data quality [3] Product Development - The Atlas G6 incorporates an extra data channel and integrates with Onto's Ai Diffract OCD analysis software, utilizing machine learning algorithms to enhance recipe robustness and reduce time to solutions [4] - Onto's Dragonfly 3Di platform continues to be a key growth driver, with over 20 systems shipped in the second quarter, addressing sub-surface defect inspection needs in advanced semiconductor and AI packaging technologies [7] Market Performance - Second-quarter memory revenues remained strong, particularly in NAND, while DRAM revenues stayed near record highs; Onto secured over $20 million in new orders for Atlas OCD and Iris films, with most revenues expected in Q4 [6][9] - The company faces challenges from U.S.-China trade tensions, with tariffs expected to add $2-$3 million in costs, impacting gross margins, which are guided at 53-55% [8] Customer Base and Risks - Onto serves various markets, including Bare Wafer and Image Sensors, with unique capabilities for detecting yield-killing voids in hybrid bonding applications [5] - The company has a high concentration risk, with the top three customers accounting for 52% of its projected 2024 revenues [8]