Core Viewpoint - The article discusses the research conducted by Li Auto on SiC (Silicon Carbide) chips, emphasizing the importance of rigorous testing methods to ensure the reliability of these chips in electric vehicles [2][3]. Group 1: Research and Development - Li Auto has developed its own SiC chips, which are crucial for handling high voltage and current in electric vehicles [2]. - The company identified a specific type of "problem chip" that poses a risk of sudden failure under harsh working conditions, which current industry standards fail to detect [2][3]. Group 2: Testing Methodology - The article highlights the UIS (Unclamped Inductive Switching) test, which simulates extreme conditions to verify the chip's ability to withstand energy surges [3]. - Results from UIS testing showed a significantly higher failure rate for chips with surface defects, confirming the effectiveness of this testing method [3]. Group 3: Chip Design and Efficiency - Li Auto utilizes hexagonal SiC cells, which offer lower conduction resistance and better reliability, although they may increase switching losses [4]. - The company has customized its SiC design to address efficiency concerns, particularly given the lower switching frequency requirements for automotive applications [4]. Group 4: Industry Context - The article mentions the involvement of a young female engineer, Jinying Yu, in the research, reflecting the rapid development of China's new energy sector [4].