Core Viewpoint - The article discusses the challenges and potential solutions related to high numerical aperture (NA) EUV lithography, particularly focusing on the issues of mask stitching and the implications of larger mask sizes on manufacturing efficiency and yield [1][2][9]. Group 1: Challenges of High NA EUV Lithography - The transition to high NA (0.55) EUV lithography presents significant challenges in circuit stitching between exposure fields, impacting design, yield, and manufacturability [1][2]. - The use of deformable optics in high NA systems reduces the exposure area of standard 6×6 inch masks by half, complicating the alignment and yield of critical layers [2][3]. - Misalignment at the stitching boundaries can lead to significant errors in critical dimensions, with a 2nm misalignment potentially causing at least a 10% error in pattern dimensions [2][3]. Group 2: Impact on Yield and Performance - The reliance on precise calibration in advanced lithography is crucial to avoid interference between features across different masks, which can lead to yield issues [3][4]. - The introduction of stitching-aware design strategies is necessary to mitigate performance degradation, with potential frequency reductions of up to 3% and increased power consumption by 3% in worst-case scenarios [5][6]. - Optimizations in design can reduce the impact of stitching on performance, with some strategies achieving a reduction in stitching area loss to below 0.5% and performance degradation to around 0.2% [6][8]. Group 3: Solutions and Industry Perspectives - Increasing the mask size to 6×11 inches could eliminate stitching issues and improve throughput, although it would significantly increase equipment costs and require extensive changes to existing manufacturing infrastructure [9][10]. - The production of larger masks poses additional challenges in stress management and defect control, which are already critical in EUV mask fabrication [10][11]. - Despite the technical advantages of larger masks, industry skepticism remains regarding the associated costs and the need for upgrades to meet future technology nodes [11].