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新研发,“闪速退火”!
新华网财经· 2025-11-16 11:22
Core Viewpoint - The research team from the Shenyang National Laboratory for Materials Science has developed a "flash annealing" process that can achieve heating and cooling rates of up to 1000 degrees Celsius per second, enabling the production of wafer-level high-performance energy storage films, which opens new pathways for the manufacturing of next-generation high-performance energy storage capacitors [1][2]. Group 1 - The "flash annealing" process allows researchers to fabricate a type of film called lead zirconate on silicon wafers in just one second, freezing the material's special structure at room temperature and forming nano-microdomains smaller than 3 nanometers, which are crucial for inducing relaxor ferroelectric behavior and achieving high-efficiency energy storage [2]. - The process enhances the film's texture, making it denser and more uniform, while effectively locking in volatile lead elements, significantly reducing material defects and leakage current [2]. - Capacitors made using this technology demonstrate excellent environmental adaptability, with minimal degradation in energy density and efficiency (less than 3%) after exposure to extreme temperatures ranging from -196 degrees Celsius to 400 degrees Celsius, indicating stable and reliable performance in various harsh environments [2]. Group 2 - Researchers have successfully produced uniform high-performance films on 2-inch silicon wafers, providing an industrially viable solution for chip-level integrated energy storage [2].
新研发,“闪速退火”!
Core Viewpoint - Researchers have developed a "flash annealing" process that can achieve heating and cooling rates of up to 1000 degrees Celsius per second, successfully fabricating wafer-level high-performance energy storage films, paving the way for the next generation of high-performance energy storage capacitors [1][2]. Group 1: Technology Development - The "flash annealing" process allows for the preparation of a lead zirconate relaxor ferroelectric film on silicon wafers in just one second [2]. - This technology freezes the special structure of materials at high temperatures to room temperature, forming nano-microdomains less than 3 nanometers in size, which are crucial for inducing relaxor ferroelectric behavior and achieving high-efficiency energy storage [2]. Group 2: Performance and Applications - The films produced using this process exhibit excellent environmental adaptability, showing minimal degradation (less than 3%) in energy density and efficiency after exposure to extreme temperatures ranging from -196 degrees Celsius to 400 degrees Celsius [2]. - The capacitors can reliably operate in extreme conditions, such as in cold outer space or hot underground oil and gas exploration wells [2]. Group 3: Industrial Potential - Researchers have successfully fabricated uniform high-performance films on 2-inch silicon wafers, providing a solution with industrialization potential for chip-level integrated energy storage [2].
科研人员研发“闪速退火”工艺 一秒“炼”就晶圆级高性能储能薄膜
Xin Hua She· 2025-11-15 08:42
Core Viewpoint - The research team from the Shenyang National Laboratory for Materials Science has developed a rapid annealing process capable of heating and cooling at a rate of 1000 degrees Celsius per second, leading to the creation of high-performance energy storage films, which opens new pathways for the manufacturing of next-generation energy storage capacitors [1][2]. Group 1: Technology Development - The newly developed "flash annealing" process allows for the preparation of a relaxor ferroelectric film made of lead zirconate on silicon wafers in just one second [1]. - This process effectively "freezes" the special structure of materials at high temperatures to room temperature, forming nano-microdomains less than 3 nanometers in size, which are crucial for inducing relaxor ferroelectric behavior and achieving high-efficiency energy storage [1]. Group 2: Performance and Applications - The capacitors manufactured using this process exhibit excellent environmental adaptability, showing minimal degradation in energy density and efficiency (less than 3%) after exposure to extreme temperatures ranging from -196 degrees Celsius to 400 degrees Celsius [2]. - The research team has successfully produced uniform high-performance films on 2-inch silicon wafers, providing an industrially viable solution for chip-level integrated energy storage [2].