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失效分析,如何助力芯片研发和良率提升?
半导体芯闻· 2026-03-16 10:26
Group 1 - The article emphasizes the importance of precise insights and efficient verification capabilities as key competitive advantages in the semiconductor industry, particularly in the context of achieving higher yield and reliability [2] - A seminar hosted by Thermo Fisher Scientific is scheduled for March 24, 2026, in Shanghai, focusing on practical solutions and case studies related to high yield and reliability in semiconductor technology [3] - The seminar will feature discussions on various topics, including material and electrical failure analysis techniques, ESD testing, and AI-driven semiconductor analysis solutions [4][6] Group 2 - The event will be held both online and offline, with free participation for all attendees, and those attending online for over 80 minutes will receive a gift [6] - The agenda includes a welcome speech, presentations on the latest integrated ball diffraction TEM technology, next-generation focused ion beam systems, and live demonstrations of advanced semiconductor solutions [7]
失效分析,如何助力芯片研发和良率提升?
半导体行业观察· 2026-03-12 01:39
Core Insights - The article emphasizes the importance of precise insights and efficient verification capabilities as key competitive advantages in the semiconductor industry, particularly as technology advances towards higher yield and reliability [2]. Event Details - The Thermo Fisher Semiconductor Solutions Seminar will take place on March 24, 2026, from 13:00 to 18:30 at the Thermo Fisher Customer Experience Center in Shanghai [3]. - The event will be conducted both online and offline, and registration is free [6]. Seminar Topics - The seminar will cover various topics including: - Physical and electrical failure analysis techniques - ESD testing and failure path verification - Multi-dimensional collaborative analysis methods - Semiconductor analysis solutions in the AI era [4]. Agenda Highlights - The agenda includes: - Welcome Speech by Trisha Rice - Introduction of Thermo Fisher's latest integrated spherical aberration-corrected TEM by Guittet Pierre-Yves - Presentation on next-generation focused ion beam systems by Michael Rauscher - Live demonstrations of Helios 5 Hydra, Helios 6 HD, and ELITE [7].