Workflow
专利研发
icon
Search documents
广立微获得发明专利授权:“探针卡针尖状况检测方法、结构、晶圆以及晶圆测试方法”
Zheng Quan Zhi Xing· 2025-07-18 21:11
Core Viewpoint - Guangli Microelectronics (301095) has recently obtained a new invention patent related to probe card tip condition detection, indicating a focus on innovation and technology advancement in the semiconductor industry [1] Group 1: Patent and Innovation - The newly authorized patent is titled "Method, Structure, Wafer, and Wafer Testing Method for Detecting Probe Card Tip Conditions" with application number CN202510517717 [1] - This year, Guangli Micro has received a total of 46 patent authorizations, representing an 84% increase compared to the same period last year [1] Group 2: Research and Development Investment - In 2024, the company invested 277 million yuan in research and development, which is a year-on-year increase of 33.49% [1] Group 3: Company Activities and Data - Guangli Micro has made investments in 16 enterprises and participated in 45 bidding projects [1] - The company holds 132 trademark records, 228 patent records, and 91 copyright records [1]