Core Insights - The article highlights the procurement dynamics of particle size analyzers in the 37th week of 2025, indicating that while universities remain the primary purchasers, there is a notable increase in demand from pharmaceutical and energy companies [2][3] - A total of 7 bids related to particle size analyzers were reported, with a cumulative bid amount of 1.7593 million yuan [3] Procurement Overview - The procurement data covers various sectors including universities, research institutes, and corporate R&D centers, showcasing a diverse range of applications for the equipment [3] - Key brands involved in the procurement include Jinan Weina, Dandong Baite, Malvern Panalytical, and German brand Sympatec, among others [3] Specific Bids and Equipment - Jinan Weina secured 2 sets of equipment: Winner2006B and Winner319C - Dandong Baite won a bid for 1 set of BT-9300S micron particle size analyzer - Sympatec was awarded a bid for 1 set of HELOS/BR laser particle size analyzer - Beijing Times New Measurement Control Equipment Co., Ltd. won a bid for 1 TP791 oil particle size analyzer - Malvern Panalytical secured a bid for 1 laser particle size analyzer - Japan's Rion won bids for both a micron-level and a nano-level liquid optical particle size analyzer [3][4]

Core Insights - The article discusses the successful completion of the "Semiconductor Material Testing Technology Forum" held on September 10, 2025, during the BCEIA 2025 event, featuring nine expert speakers who explored various aspects of semiconductor material testing and failure analysis [2][5]. Group 1: Forum Overview - The 21st Beijing Conference & Exhibition on Instrumental Analysis (BCEIA 2025) took place at the China International Exhibition Center, marking the 40th anniversary of BCEIA, with a theme focused on academic exchange and instrument exhibitions [3][34]. - The forum attracted over 300 industry professionals, both online and offline, highlighting the growing interest in semiconductor material testing [5]. Group 2: Key Presentations - Lin Miaoling from the Chinese Academy of Sciences presented on the characterization of in-plane anisotropic semiconductors using angle-resolved Raman spectroscopy, emphasizing the impact of sample thickness and substrate on Raman tensor properties [8]. - Xi Shanbin from the National Semiconductor Device Quality Inspection Center discussed the importance of semiconductor device testing and failure analysis, detailing various testing methods and their significance in product development and quality control [11]. - Ding Xin from HORIBA China showcased the application of optical spectroscopy technologies in semiconductor material characterization, highlighting the importance of high spectral resolution and sensitivity [14]. - Xu Wentao from Suzhou Laboratory discussed the development of testing capabilities for electronic chemicals, focusing on the application of domestic instruments in the semiconductor industry [17]. - Peng Jinlan from the University of Science and Technology of China presented on the development of in-situ silicon nitride thermoelectric chips for scanning electron microscopy, demonstrating their advantages over traditional sample stages [20]. - Hua Younan from Shengke Nano introduced a comprehensive failure analysis method for wafer-level quality control, advocating for the establishment of national standards to enhance quality management in semiconductor manufacturing [23]. - Li Chenhui from Beijing Xinlifang Technology Development Co., Ltd. analyzed the current state and trends of the semiconductor material testing industry from a big data perspective, emphasizing the rapid growth in demand for third-party testing services [26]. - Ma Hongtao from Beijing Software Product Quality Testing and Inspection Center discussed the common failure analysis equipment used in material research, highlighting the interdependence of failure analysis and material characterization [29]. - Ding Yang from the Chinese Academy of Sciences emphasized the critical role of Transmission Electron Microscopy (TEM) and Focused Ion Beam (FIB) technologies in analyzing semiconductor materials and devices, showcasing their applications in various fields [32].

Group 1 - The event titled "Micromeritics BET Analyzer Carbon Black and Tire Industry Application Seminar and LianKe Technology Silica Carbon Black BET Testing Demonstration Center Inauguration" was held on September 10-11, 2025, in collaboration with Micromeritics/ Malvern Panalytical, Shandong LianKe Technology Co., Ltd., and Qingdao FJ Technology Co., Ltd. [2] - The rapid growth of the Chinese automotive industry presents significant opportunities for the tire industry, with a focus on improving tire quality and lifespan becoming a core issue for related companies [2] - Carbon black, as a key raw material, directly influences the lifespan and performance of tires through its specific surface area and particle size distribution [2] Group 2 - Engineers at the seminar shared technical insights on BET and t-plot theory, characterization techniques for carbon black materials, and analysis of low specific surface materials [2] - The seminar included detailed explanations of data analysis and software operation for the BET analyzer, as well as daily maintenance of the Tristar Plus 3030 [2] - LianKe Technology aims to enhance its R&D innovation capabilities and optimize the performance of its silica and carbon black products, leveraging technology and quality to accelerate market expansion and deepen collaboration and innovation among customers [2]

Core Viewpoint - The article highlights the recent procurement of particle size analyzers in the mining and nuclear power sectors, with a notable contract awarded to Dandong Oriental Measurement and Control Technology Co., Ltd. for 1.29 million yuan in a mining project [1][4]. Group 1: Procurement Information - A total of two procurement announcements for particle size analyzers were recorded from July 7 to July 13, focusing on applications in mining material analysis and nuclear power material testing [2]. - Dandong Oriental Measurement and Control Technology Co., Ltd. won the bid for the particle size analyzer and automatic sampler for the smart selection plant construction project of Su Bei County Bolun Mining Development Co., Ltd. for 1.29 million yuan [3][4]. - The second procurement involved Shandong Hongsheng Electromechanical Co., Ltd. winning a contract for 143,736 yuan for particle size analyzers at Huaneng Shandong Shidao Bay Nuclear Power Co., Ltd. [3]. Group 2: Company Background - Qinghai Xikang Information Technology Co., Ltd., the purchasing entity for the mining project, was established in October 2016 and is a wholly-owned subsidiary of Western Mining Group Co., Ltd. [4]. - The company has achieved various certifications, including ISO 9001, and is recognized as a high-tech enterprise in Qinghai Province, demonstrating capabilities in comprehensive management consulting and smart transformation solutions for various industries [4].