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新闻速递|专家研讨柔性电子技术产业前景;超10万台“龙架构”计算机在中小学应用
Ren Min Ri Bao· 2025-11-09 21:55
Group 1: Flexible Electronics Technology Conference - The sixth International Flexible Electronics Technology Conference was held in Jiaxing, Zhejiang, attracting over 400 researchers and industry experts from China, the United States, Germany, and other regions to share cutting-edge results and discuss industry progress [1] - The conference was organized by Tsinghua University's National Key Laboratory of Flexible Electronics Technology and the Zhejiang Tsinghua Flexible Electronics Technology Research Institute [1] - The Zhejiang Tsinghua Flexible Electronics Technology Research Institute launched a pilot platform for the manufacturing of flexible integrated devices, which is open to global collaboration, providing process cooperation, pilot incubation, and solution services for enterprises, universities, and research institutions [1] Group 2: Longxin Architecture Computers in Education - Longxin Zhongke Co., Ltd. reported that over 100,000 fully autonomous computers based on the "Longxin architecture" have been applied in primary and secondary school information technology education [2] - Significant deployments have occurred in provinces such as Zhejiang, Henan, and Shanxi, with large-scale implementations reaching thousands of units and pilot programs covering nearly a thousand primary and secondary schools [2] - The "Longxin architecture," introduced in 2020, is China's first fully autonomous CPU instruction system, and its software ecosystem has been rapidly developing, supported by educational innovation collaboration plans and comprehensive training solutions [2]
我国科研人员“以柔克刚”填补微型LED晶圆无损测试技术空白
Xin Hua Wang· 2025-06-13 09:39
微型LED是下一代高端显示技术的核心元件,搭载微型LED的晶圆必须达到100%的良率,否则将会给 终端产品造成巨大的修复成本。然而,业界却一直没有找到晶圆接触式无损检测的好方法。近日,我国科 研人员用"以柔克刚"的方式填补了这一技术空白。 传统的晶圆良率检测方法有的如"铁笔刻玉",会造成晶圆表面不可逆的物理损伤;有的则只能"观其大 概",存在较高的漏检率和错检率。良率无损检测的技术空白严重阻碍了大面积显示屏、柔性显示屏等微型 LED终端产品的量产。 近日,天津大学精密测试技术及仪器全国重点实验室、精仪学院感知科学与工程系黄显教授团队打破 了微型LED晶圆测试瓶颈,实现了微型LED晶圆高通量无损测试,研究成果于13日在国际学术期刊《自然- 电子学》刊发。 图为测试系统中的柔性探针,当探针接触LED晶圆后点亮其中的一个LED发出蓝色光,通过同轴光路 可观察光强和波长信息。(受访者供图) "我们实现了从零到一的突破,填补了微型LED电致发光检测的技术空白,也为其他复杂晶圆检测提供 了革命性技术方案,随着探针阵列规模与检测通道的持续拓展,未来或将在晶圆级集成检测、生物光子学 等领域产生更广泛影响。"黄显说。 据悉,目 ...